A heat flux sensor test setup

Our gSKIN sensors have been recently used by Antti Immonen at the LAPPEENRANTA UNIVERSITY OF TECHNOLOGY to study the characterization process of semiconductor chip heat flux sensors and develop a novel, reliable and time-efficient method to characterize the sensors. This master thesis is useful to develop better heat flux sensor testing methods.  The research is available at the mentioned university’s website.

The developed setup included a wafer probing station in conjunction with a thermal excitation system. All in all, the developed method proved successful for the relative characterization of commercial and prototype heat flux sensors, but further fine-tuning is still required.

Despite this fact, this academic work is a great way to understand how sensors are tested and the challenges involved. It showcases the different testing methods available, explaining the science behind and considering the advantages and disadvantages of each of them. A nice introduction to the topic, indeed.

If you want more information about heat flux sensors and their potential applications, please download our Quick Guide to Heat Flux Applications at our website.

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